Milexia Hitachi

Hitachi High-Tech in Europe handles a wide variety of products – from electron microscopes ( SEM, TEM, FIB) or sample preparation equipments ( Ion milling systems, UV cleaners).

Products from Hitachi High Tech
in Scientific Instrumentation

Regional availability

The use of 'All' in this context resets any regional focus if applied and you will continue to browse the products as a global user showing availability in all regions.

This will include products that may not be available in your region, please see individual products for details.

Ethos NX5000 Focused Ion Beam System

Ethos NX5000 Focused Ion Beam System

Unsurpassed Performance with Ultimate Flexibility
UV Cleaner Hitachi zone Tem II

UV Cleaner Hitachi zone Tem II

Hydrocarbon compounds surface decontamination
Hitachi Ion Polisher IM4000 II & ArBlade IM5000

Hitachi Ion Polisher IM4000 II & ArBlade IM5000

The latest generation of Hitachi ion polishers are suitable for large surface preparation.

UV Cleaner Hitachi zone sem II

UV Cleaner Hitachi zone sem II

Analyze samples in the SEM without contamination
TM4000 Electron Microscope

TM4000 Electron Microscope

High‑resolution scanning electron microscopes.
TM4000III & TM4000PlusIII

TM4000III & TM4000PlusIII

Tabletop Microscope
FineSAT V

FineSAT V

Scanning Acoustic Microscop
FlexSEM1000 II

FlexSEM1000 II

Compact Scanning Electron Microscope
Hitachi HT7800 TEM Series

Hitachi HT7800 TEM Series

Low Voltage TEM (120kV)
HItachi H-9500 TEM

HItachi H-9500 TEM

High Voltage TEM (300kV)
Hitachi HF-5000 TEM/STEM

Hitachi HF-5000 TEM/STEM

200 kV aberration-corrected TEM/STEM
Hitachi Field Emission HF-3300 TEM

Hitachi Field Emission HF-3300 TEM

High Voltage TEM FEG (300kV)
NX-9000 Focused Ion Beam System

NX-9000 Focused Ion Beam System

FIB-SEM System for True 3D Structural Analysis
NX-2000 Focused Icon Beam System

NX-2000 Focused Icon Beam System

FIP-SEM for large samples up to 200mm
SU3800

SU3800

Variable Pressure Scanning Electron Microscope
SU3800SE / SEPlus

SU3800SE / SEPlus

High Resolution Schottky Scanning Electron Microscope
SU3900SE / SE Plus

SU3900SE / SE Plus

High Resolution Schottky Large Chamber Scanning Electron Microscope
Hitachi – SU3900SE

Hitachi – SU3900SE

Schottky field emission SEM with variable pressure and extra‑large specimen chamber.
SU3900

SU3900

Very Large Specimen Chamber Variable Pressure SEM

SU5000

SU5000

Field emission & variable pressure scanning electron microscope
SU8600

SU8600

Hitachi Ultrahigh-resolution Field-emission Scanning electron microscope
SU9000 II

SU9000 II

Ultra-high Resolution Scanning Electron Microscope
SU7000

SU7000

Ultra-High-Resolution Schottky Scanning Electron Microscope
HiLEM IL1000 Ionic Liquid

HiLEM IL1000 Ionic Liquid

Hitachi Innovation for Hitachi Electron Microscopes. The Latest in Sample Preparation.

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