SU3800SE / SEPlus
High Resolution Schottky Scanning Electron Microscope
This product is available from Milexia France and Milexia Iberica
The SU3800SE and SU3800SE Plus Schottky SEMs provide access to very high resolution, without compromising on sample size, sample variety or analytical capabilities.
The SU3800SE and SU3800SE Plus combine simple data acquisition with intuitive and safe operation, making them accessible to both novice and experienced users thanks to adapted graphical interface.
Available with or without an in-lens electron detector, they offer a wide range of upgrade options to suit changing laboratory needs and budgets.
Features and variations
- Guaranteed resolution at 30kV: 0.9nm - Guaranteed resolution at 1kV: 2.5nm - Guaranteed resolution at 1kV-D*: 1.6nm
- Continuous magnifications: x5 to x600,000
- Acceleration voltage: 0.5kV to 30Kv
- Deceleration voltage*: 0.1kV to 2kV
- Probe current: 150nA max
- Pressure range (in low vacuum mode): 6Pa to 150Pa
- Maximum sample size: 200mm diameter and 80mm height
- Movement on 5 motorised axes
- Detectors : SED, BSED, TD (SE Plus) and UVD*