TM4000III & TM4000PlusIII
Tabletop Microscope
The new generation of Hitachi TM4000III and TM4000PlusIII Benchtop Scanning Electron Microscopes meet the needs of all laboratories that want to check the topography of their samples from millimeter to submicron scale and determine their chemical composition.
Hitachi High Tech introduces the TM4000III and TM4000Plus III, 20 years after the very first benchtop SEM was launched. With more than 5,800 units installed worldwide, Hitachi confirms its position as the global market leader in Benchtop Scanning Electron Microscopes (also known as MiniMEB™ or benchtop SEM).
This new generation brings a host of improvements, including automatic functions that simplify everyday tasks such as moving the stage, magnification and image capture.
The TM4000PlusIII features an optical sample viewer for easy location of areas of interest and automatic navigation through multiple sample holders.
The ‘low vacuum’ mode allows direct observation of any type of sample, whether conductive or insulating, dry, greasy or wet.
The TM4000PlusIII is also equipped with a secondary electron detector (UVD), which can be used in low vacuum mode.
In addition, it incorporates new IFT technology to monitor filament life, avoiding the worry of unpredictable filament breakage during periods of heavy use.
An energy-selective X-ray spectrometer (EDS) using a large-area Silicon Drift Detector (SDD) determines composition from the boron element and enables elemental mapping. Hitachi offers a choice of Bruker Quantax, Oxford Aztec or EDAX models.
A wide range of accessories are available :
- STEM device
- Hitachi Map 3D software: 3D reconstruction, grain and particle analysis, surface texture, volume and profile analysis, fibre analysis, collocation…
- Software for automatic image acquisition over several zones
- Macro function
Features and variations
- Simple, intuitive operation
- Minimal sample preparation
- High sensitivity BSE detector - various imaging possibilities thanks to the 4-segment BSE detector
- Suitable for non-conductive samples
- Acceleration voltages: 5kV, 10kV, 15kV and 20kV with 5 probe currents per voltage
- Magnification: x10 to x100000 (reference to photo format)
- Maximum sample size: 80mm diameter and 50mm height
- Patented SE detector for observation of roughness and fine surface detail (in TM4000Plus III configuration)
- Sample current display (TM4000Plus III configuration)
- Can be upgraded to suit your needs