Microscopy at the Frontiers of Science Conference 2025 has established itself as a reference event in the field of microscopy, attracting international researchers and fostering interdisciplinary exchange.
Milexia Ibérica is pleased to confirm its participation in MFS 2025 (Microscopy at the Frontiers of Science Conference 2025), taking place from September 23rd to 26th in Valencia, Spain. This event has established itself as a key meeting point for the scientific community focused on microscopy, fostering interdisciplinary collaboration and knowledge exchange among researchers from around the world.
The congress program will begin with an inaugural workshop dedicated to single-particle analysis using Cryo-EM, an advanced technique in structural biology. This will be followed by three full days of lectures delivered by at least six renowned international speakers, who will address current topics in three main areas: materials science, life sciences, and cryo-electron microscopy (CryoEM). These sessions will cover both the latest technical advances and emerging trends in the field.
Throughout the event, our team of experts will present a live demonstration of the Hitachi TM4000PLUSII scanning electron microscope (SEM). This state-of-the-art instrument sets new standards in electron microscopy, offering exceptional usability, high performance, and remarkable versatility for sample analysis. Attendees will have the opportunity to explore its advanced features and discover how this technology can significantly improve SEM/TEM analytical capabilities.
Live Demonstration of the TM4000PLUSII
The demonstration will allow attendees to gain in-depth knowledge of the TM4000PLUSII‘s capabilities, highlighting its main advantages:
- Intuitive Operation: Optimized system for users of all levels, featuring an accessible interface and automated controls.
- Exceptional Image Quality: High resolution and enhanced contrast for precise material characterization.
- Analysis Flexibility: Capable of operating in both high and low vacuum modes, making it ideal for various scientific and industrial applications.
- Advanced Detection: Integration of secondary and backscattered electron detectors to obtain maximum structural and compositional information.
MFS 2025 represents a unique opportunity to learn about the latest developments in microscopy, build professional connections, and participate in a high-level scientific environment.
For more information and registration, please visit the official conference website here
We look forward to seeing you there!