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Vista 300

Vista 300 is the most advanced nano-chemical meteorology instrument for R&D and failure analysis in nanofabrication.

This product is available from Milexia France

    Vista 300 is the most advanced nano-chemical meteorology instrument designed for research and development (R&D) as well as failure analysis in nanofabrication. Its cutting-edge features and innovations make it an essential tool for professionals in the field.

    AutoPiFM

    • Automated Data Generation: AutoPiFM creates a comprehensive dataset from scratch, providing fixed-wavenumber PiFM images for every detected chemical component, as well as PiF-IR spectra in each chemical phase.
    • Ease of Use: Simply set up AutoPiFM and let it handle the complex data generation, making your work easier and more efficient.

    Automatic Alignment

    • Computer Vision Technology: This industry-first feature uses computer vision to automatically align the excitation laser, ensuring optimal results with minimal user intervention.
    • Time and Training Efficiency: Reduce training time and improve productivity with precise and reliable laser alignment.

    Compact Footprint

    • Integrated Design: Our automated beam alignment and integrated multiplexer allow for the lasers to be housed below the main instrument, resulting in a more compact and efficient design.
    • Dual Laser Support: Vista 300 can support up to two lasers to cover the full infrared (IR) spectral range, enhancing its versatility (see specifications for details).

    Controlled Environment

    • Efficient Sample Handling: The 400 mm wide sample access door maximizes throughput while minimizing thermal disturbances that could cause drift.
    • Stable Operating Conditions: The insulated metal enclosure ensures acoustic isolation and maintains stable temperature control within 0.1 °C, making it suitable for clean room environments.

    Functionality

    • Imaging modes: Non-contact AFM, PiFM, KPFM, cAFM, nano DMA, FvD (force vs distance) mapping.
    • Spectroscopy modes: PiF-IR, FvD.
    • PiF Laser Options: QCL (770 – 1840, 1995 – 2395 cm−1), OPO/DFG (590 – 2050, 2250 – 4400, 5000 – 7000 cm−1).
    • Depth probed (IR): 20 nm in surface mode & greater than 100 nm in bulk mode.

    Stage and scanner

    • Sample stage travel: 200 mm × 200 mm square.
    • Scan size: 120 µm × 120 µm.
    • Dual Z Feedback: 12 µm z-scanner with 600 nm fast-z scanner provides both high bandwidth and a large z-range

    Resources

      Download the Molecular Vista Datasheet

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