S wide
Large Area 3D Optical Metrology System
This product is available from Milexia France
The S wide is a high performance large area non-contact 3D optical metrology system designed for micro-scale measurements, with advanced inspection and analysis capabilities.
The S wide is a dedicated solution designed to quickly measure large sample areas up to 300x300mm.
It offers all the advantages of a digital microscope integrated into a high resolution measuring instrument.
Extremely easy to use with a single data acquisition button.
Some features of the S wide :
- Sub-micron height repeatability over the entire extended area
- One-shot height measurement up to 40mm without Z-axis scanning
- Very low field distortion bi-eccentric lenses for accurate metrology
- Shape deviation from 3D CAD models
