Calibration graticules and Measurement standards
Calibration graticules and Measurement standards ensure precise and repeatable analysis in microscopy. Total confidence in your measurements!
Ted Pella Calibration graticules and Measurement standards are key tools for precise calibration and measurement in electron microscopy and other scientific analyses.
These standards ensure accurate calibration of TEM and SEM instruments for reliable observations and measurements.
Calibration Graticules
Used to adjust and verify instrument measurement precision, calibrating magnification, resolution, and other critical parameters.
Manufactured with precise, traceable dimensions for exact equipment calibration, they support research labs, semiconductor fabrication, nanotechnology, and materials science.
Measurement Standards
Provide reliable references for measuring dimensions, lengths, and sample features. Include diffraction patterns, calibration grids, and known scales for comparison and validation, ensuring consistency across instruments and time periods.
TEM Calibration
- Gold/Carbon Combined Test Specimen
- Aluminum Diffraction Standards
- Catalase Crystals
- Polystyrene Latex Magnification Test Specimens
SEM Calibration
- Pelcotec™ CDMS Critical Dimension Magnification Standards
- Pelcotec™ G-1 Silicon Calibration Specimen 1µm Pitch
- Pelcotec™ LMS-20 Low Magnification Calibration Pattern
- Low Magnification Calibration Ruler
Applications
- Data Verification: Used to verify the accuracy of measurements obtained during research and product development.
- Quality Control: Critical in manufacturing processes requiring precise, traceable measurements.
- Equipment Calibration: Essential for routine calibration of electron microscopes, spectrometers, and other analysis equipment.