TM4000 Electron Microscope
High‑resolution scanning electron microscopes.
This product is available from Milexia Iberica
TM4000 series scanning electron microscopes are easy to use, compact, and environmentally friendly. They include backscattered electron and SE detectors, with the option to combine images.
They are supplied with a pre‑centered tungsten filament cartridge that simplifies in‑situ maintenance and provide accelerating voltages from 5 to 20 kV for EDX analysis.
The software offers several automatic functions such as brightness, contrast, focus, report generation, image and parameter storage, and sample stage position control, while the Windows 10 compatible application ensures smooth integration into existing software environments.
- Optional EDX systems from Bruker (Quantax 75), Oxford (Aztec series), and EDAX (Elements)
- Samples sizes up to 80 mm in diameter and 50 mm in height.
- A pre‑centered tungsten cartridge filament supports operation at accelerating voltages between 5 and 20 kV with magnifications up to 250,000x,
- low‑vacuum mode (ChargeUp Reduction) allows analysis of non‑conductive samples.
- Available options include RTEM, a variety of sample stages, image stitching, and Navcam.
- The detection system combines a four‑quadrant BSE detector with an Everhart‑Thornley SE detector, with the option to merge BSE and SE signals in a single image.