SU3900SE / SE Plus
High Resolution Schottky Large Chamber Scanning Electron Microscope
The SU3900SE and SU3900SE Plus large-chamber Schottky SEMs provide access to very high resolution, without compromising on size, sample variety or analytical capabilities.
The SU3900SE and SU3900SE Plus combine easy data acquisition with intuitive operation and safe use, while enabling the analysis of larger and heavier samples than traditional FEG SEMs. This makes it possible to examine large, heavy samples such as industrial materials such as iron and steel, automotive components and aerospace parts.
Available with or without an in-lens electron detector, they offer a wide range of upgrade options to meet the changing needs of laboratories and budgets.
Their graphical interfaces provide access to functions in a way that is suitable for both novice and experienced users.
Features and variations
- Guaranteed resolution at 30kV: 0.9nm - Guaranteed resolution at 1kV: 2.5nm - Guaranteed resolution at 1kV-D*: 1.6nm
- Continuous magnifications: x5 to x600,000
- Acceleration voltage: 0.5kV to 30Kv
- Deceleration voltage*: 0.1kV to 2kV
- Probe current: 150nA max
- Pressure range (in low vacuum mode): 6Pa to 150Pa
- Maximum sample size: 300mm diameter and 130mm height
- Movement on 5 motorised axes
- Detectors : SED, BSED, TD (SE Plus) and UVD*