S neox Grand Format
With its expansive 600 x 600 mm travel range and certified semiconductor characterization, this system ensures consistent and reliable performance. Equipped with advanced 3-in-1 technology, it delivers unparalleled measurement versatility, making it the ultimate solution for large-panel applications in semiconductor, display, and PCB industries
This product is available from Milexia France
The S neox Grand Format offers a complete solution, from the hardware to the software perspective, for 3D surface measurements of large panels in semiconductor, display, and PCB industries.
Remove Weight Limitations
Unlimited measurement capabilities
- Expansive 600 x 600 mm travel range: An impressive travel range of 600 x 600 mm with a speed of one meter per second.
- Close-loop XY gantry design: Consistent performance regardless of sample weight due to a close-loop XY gantry design.
Enhanced Safety
Certified for semiconductor characterization
- Industry standards compliance: This system has been carefully designed to meet several industry standards, such as SEMI S2 and S8.
- TÜV Rheinland certification: Certified by TÜV Rheinland to ensure optimal safety and reliability.
Key Features
- Travel range: 600 x 600 mm
- Speed: 1 meter per second
- Design: Close-loop XY gantry
- Safety: Compliant with SEMI S2 and S8 standards, TÜV Rheinland certified
- Technologies: Three integrated optical technologies for precise measurements
Applications
- Semiconductor industry
- Display industry
- PCB industry