PELCO LatticeAx 420
PELCO LatticeAx 420: 10µm cleaving accuracy in <5 min for SEM/TEM. Milexia supplies precision tools Europe-wide.
Elevate Sample Prep with PELCO LatticeAx 420
Ultimate Precision in SEM Sample Cleaving from Milexia
The PELCO LatticeAx 420 excels in sample preparation for SEM and TEM, offering scribeless cleaving with exceptional accuracy for labs worldwide.
Now available through Milexia’s pan-European network, this system from Ted Pella (formerly LatticeGear) transforms workflows in scientific instrumentation.
Key Features of LatticeAx 420
It achieves ±10 µm cleaving accuracy in under 5 minutes, ideal for diverse materials like silicon, GaAs, sapphire, and glass.
The patented base integrates a vision package with a monocular zoom microscope (0.58-7x mag, 4 µm resolution),
color CCD camera, real-time software, and X-Y stage for precise targeting.
Ergonomic design includes a polished diamond indenter with 5 µm step control, clock dial for depth calibration, vacuum pump for secure holding, and a compact footprint for cleanroom use.
Simple mechanics ensure repeatable results for users of all skill levels, minimizing particles and front-side damage.
Why Milexia Powers Your Microscopy Needs
Milexia delivers the LatticeAx 420 with expert support, from selection to integration, enhancing SEM/TEM prep in failure analysis and R&D.
Available globally, it supports “sample preparation SEM Europe” searches with reliable, innovative solutions.
Technical Specifications
- Cleaving accuracy: ±10 µm
- Process time: <5 minutes from setup to cleave
- Indent positioning: 5 µm step size; diamond tip indenter
- Imaging: Monocular parfocal zoom lens (0.58-7x), color CCD camera, real-time software
- Sample compatibility: Wide range of sizes, thicknesses, materials (e.g., wafers up to 300 mm with optional platform)
- Controls: Coarse/fine focus, pneumatic vacuum switch
- Footprint: Compact workstation; no special utilities required
- Included: Vacuum pump, XY stage; computer/monitor separate