Physical Electronics (PHI) nanoTOF 3
Parallel Imaging MS/MS
Milexia France partners Physical Electronics (PHI) nanoTOF 3 Parallel Imaging MS/MS instrument was designed with “No Compromise” in mind ensuring that there are no compromises in analytical performance. The synergistic design optimizes and combines multiple performance metrics into straight forward modes of analysis.
It provides high lateral resolution and high mass resolution simultaneously in the HR2 mode of analysis. The patented mass spectrometer provides superior imaging of highly topographic samples and high mass resolution spectra with excellent mass accuracy over the entire mass range.
PHI’s integrated MS/MS enables confident peak identification and delivers high speed TOF-TOF mode imaging at > 8 kHz. The sample stage provides full 5-axis sample motion with active temperature control. Productivity is maximized with a high level of automation and intuitive software.
Features:
• Patented pulsed dual-beam charge neutralization for truly turn-key insulator analysis
• Combination of proven stage, sample parking & software queue for continuous automated measurements
• Bi cluster emitter with smaller beam diameter for improved high-throughout HR2 imaging analysis
• Modern ergonomic design, reduced footprint and reduced power consumption
- Parallel Imaging MS/MS mass analyzer
- 30 kV LMIG with Bi, Au, or Ga emitter & HR2 imaging
- Pulsed dual-beam charged neutralizers
- In situ optical viewing
- Integrated bakeout facilities
- Secondary electron detector
- 5 kV gas gun (Ar only)
- Oxygen flood module
- SmartSoft-TOF instrument control and TOF-DR data reduction software packages
- 5 axis sample stage with in vaccuum parking
- Analysis chamber with four ion beam ports & high-throughput turbo molecular pumping