Physical Electronics (PHI) PHI 710

The PHI 710 Scanning Auger Nanoprobe from Milexia France partner Physical Electronics, is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces.

Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.

Unique Technology

• Coaxial electron gun and analyzer geometry provides the sensitivity and unobstructed vision needed to fully characterize the microstructures that exist on most real-world samples.
• Auger data is obtained from all sides of particulates and between particles with equally high sensitivity providing Auger maps with meaningful compositional information.
• Imaging of textured or curved samples without analyzer induced shadowing

Superior Auger Imaging

• High performance electron optics, precision sample handling, and advanced vibration and thermal isolation provide a superior environment for nano-scale Auger imaging and analysis
• Working magnifications of 500,000 X and higher
• Robust mage registration for unattended automated micro-area analysis

Nanoscale Thin Film Analysis

• Floating column ion gun provides a broad range of depth profiling capabilities
• Higher ion beam energies (2-5 keV) allow structures several microns thick can be routinely depth profiled
• The use of lower accelerating voltages reduces sputter mixing that could broaden the observed interfaces in an ultra thin (<5 nm) film structure

Modern, Easy To Use Software Platform

• Intuitive, fully integrated, Windows™ software platform controls all instrument functions
• Session tabs guide you through the analysis process
• Seamless interface to PHI MultiPak, the most comprehensive data reduction and interpretation software package available for electron spectroscopy

Multiple Optional Technique Add-ons And Accessories For Specialized Experiments

• Liquid metal focused ion beam (FIB) allows for in-situ cross-sectioning of particles, defects and coatings
• Energy Dispersive X-ray Spectroscopy (EDS) detector provides information about elemental qualitative and quantification. The windowless software driven motor-controlled detector has a short working distance for wide acceptance angles
• Backscattered Electron Detector (BSE) provides topographic information and compositional information of the sample by using a four-quadrant detector.
• Electron Backscatter Diffraction (EBSD) detector provides information about crystal structure and grain orientation