FineSAT V

FineSAT V offers high-precision, high-speed inspection of semiconductors and electronic components using ultrasonic waves (up to 25% faster measuring time *).

Faster : scanning speed up to 2000mm/s

More accurate  : high definition scanner allowing to acquire up to 2000 million points

Higher resolution : visible defects from the micrometer

Optimised ergonomics : fast, risk-free loading of samples, visualisation of the sample during analysis

Hitachi Power Solutions (2966 employees) is the world leader in the acoustic microscopy market with over 2600 units installed worldwide.

Hitachi Power Solutions has been in business since 1983, and until now has been mainly active in Asia, introducing a new model “Fine SAT V” to meet the needs of the European and American markets.

The FineSAT V is a Scanning Acoustic Microscope (SAM), also known as Scanning Acoustic Tomography (SAT). The FineSAT V uses ultrasonic frequencies to produce images that reflect the interior of samples. This enables non-destructive detection and identification of non-visible micrometre-scale defects such as internal delamination, voids, cracks, particle inclusions and density changes.

A wide range of probes (up to 400MHz) developed and produced by Hitachi Power Solutions enables the capabilities of the technique to be perfectly matched to the different materials and dimensions required.

The FineSAT V is often used in quality control, inspection and failure analysis of microelectronic components and materials.

*compared to the conventional FineSAT III model