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Milexia Products / Scientific Instrumentation / Atomic Force Microscopy (AFM) / Vista-75

Vista-75

Near-Field Infrared Microscopy

This product is available from Milexia France
Vista-75

The next generation of PiFM and PiF-IR instruments.

Smaller footprint:
Vista 75 has been made more compact. With a completely new acoustic enclosure, Vista 75 now takes up over 60% less space than Vista One.
Accessible design: Easy sample access and a one-handed AFM head clamp make tip and sample exchanges a breeze. The lightweight removable enclosure and open design make optical alignments easy.
Larger samples: With 75 mm of stage travel, sample size no longer matters! If it fits on the stage, Vista 75 can provide results.

 

Quick-change optics: Pre-aligned optics make switching between PiFM + PiF-IR, sSNOM, and Raman effortless. Robust laser integration A 3D-actuated PM mirror keeps excitation lasers aligned to the apex of the AFM tip for all types of tip-enhanced measurements, including PiFM, PiF-IR, s-SNOM, and tip-enhanced Raman.
Self-contained system:  No need for a special environment. Vista 75 is complete with built in vibration isolation and a temperature controlled acoustic enclosure with dry air.

 

Sub-5 nm IR spatial resolution: PiFM chemical mapping provides unbeatable lateral IR resolution for analyzing surface chemistry. An elementary cellulose fibril is embedded in the lignin matrix of a cell wall from spruce wood. Scan dimensions: 150 nm × 150 nm × 10.5 nm.

 

Single-molecule level sensitivity PiF-IR: PiF-IR spectra (magenta and green) show the chemical differences on and off these peptoid nano-sheet fragments. PiFM: PiFM chemical maps are able to detect peptoid fragments that are only 0.5 nm taller than the surrounding material! Scan dimensions: 500 nm × 500 nm × 1.7 nm.

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