Scientific Instrumentation product categories
available in France
Atomic Force Microscopy (AFM)
The best solution instruments for anyone working with nano‑scale materials, chemistry, or physics.
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Automatic inspection and control of semiconductors
Advanced automated solutions for the inspection, measurement, and quality control of semiconductor components, ensuring high precision, reliability, and optimized production efficiency throughout the manufacturing process.
Focused Ion Beam
High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation
Optical profilometry
Non-contact 3D surface profilers and integrable solutions to provide you with a tool that increases the quality of your products.
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Sample preparation equipment for SEM
Cryo preparation systems, carbon coaters, glow discharge and critical point dryers to maximize resolutions
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Scanning Acoustic Tomography
Non-destructive equipment for detecting and imaging microscopic structures or defects inside semiconductors and electronic components.
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Scanning Electron Microscopy (SEM)
High-resolution SEM & VP-SEM (FEG-SEM) with advanced optics and innovative detectors, delivering unmatched performance in imaging and analysis.
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SEM Accessories
Accessories to provide the latest capabilities for your Electron Microscopy instruments
Transmission Electron Microscopy (TEM)
A range of high and low voltage TEMs to characterise structure and chemical samples composition in materials science and the characteristics of cells in biology or medicine
X-ray Microscopy
X-ray microtomography (µCT) is a high-resolution imaging technique that uses X-rays to create detailed 3D representations of an object's internal structure in a nondestructive way. By capturing multiple X-ray projections from different angles, the system reconstructs cross-sectional images, allowing scientists to analyze materials, biological samples, or industrial components with exceptional precision.