Scientific Instrumentation product categories
available in France

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM)

The best solution instruments for anyone working with nano‑scale materials, chemistry, or physics.

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Automatic inspection and control of semiconductors

Advanced automated solutions for the inspection, measurement, and quality control of semiconductor components, ensuring high precision, reliability, and optimized production efficiency throughout the manufacturing process.

Focused Ion Beam

Focused Ion Beam

High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM observation

Optical profilometry

Optical profilometry

Non-contact 3D surface profilers and integrable solutions to provide you with a tool that increases the quality of your products.

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Sample preparation equipment for SEM

Sample preparation equipment for SEM

Cryo preparation systems, carbon coaters, glow discharge and critical point dryers to maximize resolutions

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Sample preparation equipment for TEM

Sample preparation equipment for TEM

Sample preparation equipment for TEM

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Scanning Acoustic Tomography

Scanning Acoustic Tomography

Non-destructive equipment for detecting and imaging microscopic structures or defects inside semiconductors and electronic components.

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

High-resolution SEM & VP-SEM (FEG-SEM) with advanced optics and innovative detectors, delivering unmatched performance in imaging and analysis.

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SEM Accessories

SEM Accessories

Accessories to provide the latest capabilities for your Electron Microscopy instruments

Surface Analysis

Surface Analysis

SIMS, AES and XPS Surface Analysis equipment

TEM Accessories

TEM Accessories

MET Cameras, sample holders for high quality imaging

Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy (TEM)

A range of high and low voltage TEMs to characterise structure and chemical samples composition in materials science and the characteristics of cells in biology or medicine

X-ray Microscopy

X-ray Microscopy

X-ray microtomography (µCT) is a high-resolution imaging technique that uses X-rays to create detailed 3D representations of an object's internal structure in a nondestructive way. By capturing multiple X-ray projections from different angles, the system reconstructs cross-sectional images, allowing scientists to analyze materials, biological samples, or industrial components with exceptional precision.

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